Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits

We demonstrate how the need to cope with operational faults enables evolving circuits to find more fit solutions. The analysis of the results obtained in different experimental conditions indicates that, in absence of faults, evolution tends to select circuits that are small and have low phenotypic variability and evolvability. The need to face operation faults, instead, drives evolution toward the selection of larger circuits that are truly robust with respect to genetic variations and that have a greater level of phenotypic variability and evolvability. Overall our results indicate that the need to cope with operation faults leads to the selection of circuits that have a greater probability to generate better circuits as a result of genetic variation with respect to a control condition in which circuits are not subjected to faults.

Publication type: 
Articolo
Author or Creator: 
Milano, Nicola
Nolfi, Stefano
Publisher: 
Public Library of Science, San Francisco, CA , Stati Uniti d'America
Source: 
PloS one 11 (2016). doi:10.1371/journal.pone.0158627
info:cnr-pdr/source/autori:Milano, Nicola; Nolfi, Stefano/titolo:Robustness to Faults Promotes Evolvability: Insights from Evolving Digital Circuits/doi:10.1371/journal.pone.0158627/rivista:PloS one/anno:2016/pagina_da:/pagina_a:/intervallo_pagine:/volume
Date: 
2016
Resource Identifier: 
http://www.cnr.it/prodotto/i/366496
https://dx.doi.org/10.1371/journal.pone.0158627
info:doi:10.1371/journal.pone.0158627
http://journals.plos.org/plosone/article?id=10.1371/journal.pone.0158627
Language: 
Eng
ISTC Author: 
Stefano Nolfi's picture
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